ROBIN WIECK, Mischa; OUROUMIDIS, Stilianos; DIRK WIECK, Andreas. Frequency-domain Characterization of Reverse Recovery Charge (QRR) in Commercial 1N4003 pn-Silicon Diodes. International Journal of Physics Research and Applications, [S. l.], p. 265–268, 2025. DOI: 10.29328/journal.ijpra.1001134. Disponível em: https://www.physicsresjournal.com/ijpra/article/view/ijpra-aid1134. Acesso em: 16 sep. 2025.