Figure 4

Failure-oriented-accelerated-testing (FOAT) and its role in assuring electronics reliability: review

E Suhir*

Published: 06 January, 2023 | Volume 6 - Issue 1 | Pages: 001-018

ijpra-aid1048-g004

Figure 4:

Figure 4: FOAT data (left): tests continued until half of the population failed; the wear-out portion of the experimental bathtub curve (right) is approximately of the same duration as its steady-state portion Experimental BTC for solder joint interconnections in a flip-chip Si-on-Si Bell Labs design. The arrow indicates the initial point of the IMP of the BTC, where the critical time derivative of the nonrandom SFR should be determined. It is the level of this derivative that helps to answer the basic “to BIT or not to BIT” question.

Read Full Article HTML DOI: 10.29328/journal.ijpra.1001048 Cite this Article Read Full Article PDF

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